Surface characterization by ion scattering spectroscopy

Title: Surface characterization by ion scattering spectroscopy
Creator: O'Connor, D. J.; Gladys, M. J.
Relation: Reference Module in Chemistry, Molecular Sciences and Chemical Engineering p. 244-277
Publisher Link: http://dx.doi.org/10.1016/B978-0-12-409547-2.11442-8
Publisher: Elsevier
Resource Type: book chapter
Date: 2015
Description: Ion scattering techniques have demonstrated capability to probe the composition and structure of the surface region of materials with a depth selectivity that depends on projectile energy. At low energies, it can provide surface atomic layer-specific information, while at high energies, it can provide information to depths of over a micron. Developments in equipment, the nature of the projectiles used, and the theoretical understanding of the processes involved in scattering have allowed the lowest-energy technique using projectiles < 10 keV to be optimized to either probe the surface atomic layer or differentiate the first few atomic layers that are crucial to an understanding of how a material interacts with its environment.
Subject: adsorption; alkali scattering; segregation; surface structure
Identifier: http://hdl.handle.net/1959.13/1327341
Identifier: uon:25638
Identifier: ISBN:9780124095472
Language: eng

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